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1 Ergebnisse
1
Study of growth parameters on the well-oriented InxAl1-xN u..:
, In:
2021 9th International Symposium on Next Generation Electronics (ISNE)
,
Song, Wenqing
;
Li, Tao
;
Zhu, Wenhui
.. - p. 1-3 , 2021
Link:
https://doi.org/10.1109/ISNE48910.2021.9493639
RT T1 <cTitle>2021 9th International Symposium on Next Generation Electronics (ISNE)</cTitle>: T1 <Title>Study of growth parameters on the well-oriented InxAl1-xN using sputtering on Si (100) substrate</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9493639&Exemplar=1&LAN=DE A1 Song, Wenqing A1 Li, Tao A1 Zhu, Wenhui A1 Zhang, Lei A1 Wang, Liancheng YR 2021 SN 2378-8607 K1 Temperature measurement K1 Photovoltaic systems K1 Temperature K1 Current measurement K1 Nonhomogeneous media K1 Time measurement K1 Silicon K1 InxAl1–xN films K1 XPS K1 magnetron sputtering K1 Structural properties SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ISNE48910.2021.9493639 DO https://doi.org/10.1109/ISNE48910.2021.9493639 SF ELIB - SuUB Bremen
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