I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Extraction of Complex Permittivity of Dielectrics on Packag..:
, In:
2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
,
Lin, Yi-Ting
;
Kuo, Hung-Chun
;
Wu, Po-I
... - p. 564-569 , 2021
Link:
https://doi.org/10.1109/ECTC32696.2021.00100
RT T1 <cTitle>2021 IEEE 71st Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Extraction of Complex Permittivity of Dielectrics on Package from W-band to D-band</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9501788&Exemplar=1&LAN=DE A1 Lin, Yi-Ting A1 Kuo, Hung-Chun A1 Wu, Po-I A1 Jhong, Ming-Fong A1 Pan, Po-Chih A1 Liu, Chung-Yuan A1 Wang, Chen-Chao A1 Wu, Tzong-Lin YR 2021 SN 2377-5726 K1 Dielectric constant K1 Power transmission lines K1 Permittivity measurement K1 Dielectric loss measurement K1 Transmission line measurements K1 Surface roughness K1 Calibration K1 complex permittivity K1 dielectric constant K1 dielectric loss tangent K1 packaging material K1 dielectric-material measurements K1 D band SP 564 OP 569 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32696.2021.00100 DO https://doi.org/10.1109/ECTC32696.2021.00100 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
