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1 Ergebnisse
1
Line Coupling, Ground Defect, Port Termination, and Line Pa..:
, In:
2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
,
Hwang, Lih-Tyng
;
Huang, Ming-Yuan
;
Lin, Hung-Chih
. - p. 1246-1251 , 2021
Link:
https://doi.org/10.1109/ECTC32696.2021.00202
RT T1 <cTitle>2021 IEEE 71st Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Line Coupling, Ground Defect, Port Termination, and Line Parameters Extraction for Coupled Lines with Mixed-mode Stimuli</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9501821&Exemplar=1&LAN=DE A1 Hwang, Lih-Tyng A1 Huang, Ming-Yuan A1 Lin, Hung-Chih A1 Huang, Chien-Chang YR 2021 SN 2377-5726 K1 Couplings K1 Current measurement K1 Scattering K1 Electronic components K1 Scattering parameters K1 Microstrip K1 Feeds K1 CPL (Coupled Line) K1 Single-ended and mixed-mode feeds K1 Differential & common mode stimuli K1 Coupled line K1 Stripline K1 and Co-planar ground K1 Virtual ground K1 Defect ground K1 Network analyzer SP 1246 OP 1251 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32696.2021.00202 DO https://doi.org/10.1109/ECTC32696.2021.00202 SF ELIB - SuUB Bremen
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