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1 Ergebnisse
1
Design of Test Compression for Multiple Scan Chains Circuit:
, In:
2021 International Conference on System, Computation, Automation and Networking (ICSCAN)
,
Manikya, D Manasa
;
Jagruthi, Marala
;
Anjum, Rana
. - p. 1-5 , 2021
Link:
https://doi.org/10.1109/ICSCAN53069.2021.9526387
RT T1
2021 International Conference on System, Computation, Automation and Networking (ICSCAN)
: T1
Design of Test Compression for Multiple Scan Chains Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-9526387&Exemplar=1&LAN=DE A1 Manikya, D Manasa A1 Jagruthi, Marala A1 Anjum, Rana A1 K, Ashok Kumar YR 2021 K1 Automatic test equipment K1 Automation K1 Linear feedback shift registers K1 Logic gates K1 Hardware K1 Delays K1 Field programmable gate arrays K1 Design for Testability K1 LFSR K1 Test Compression K1 State Skipping method K1 Decompression SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICSCAN53069.2021.9526387 DO https://doi.org/10.1109/ICSCAN53069.2021.9526387 SF ELIB - SuUB Bremen
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