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Design of Test Compression for Multiple Scan Chains Circuit:

, In: 2021 International Conference on System, Computation, Automation and Networking (ICSCAN),
Manikya, D Manasa ; Jagruthi, Marala ; Anjum, Rana. - p. 1-5 , 2021
Link: https://doi.org/10.1109/ICSCAN53069.2021.9526387