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1 Ergebnisse
1
Targeting Zero DPPM through Adoption of Advanced Fault Mode..:
, In:
2021 IEEE International Test Conference India (ITC India)
,
Acharya, Aravinda
;
Naresh, Nikita
;
Narayanan, Prakash
... - p. 1-6 , 2021
Link:
https://doi.org/10.1109/ITCIndia52672.2021.9532687
RT T1
2021 IEEE International Test Conference India (ITC India)
: T1
Targeting Zero DPPM through Adoption of Advanced Fault Models and Unique Silicon Fall-out Analysis
UL https://suche.suub.uni-bremen.de/peid=ieee-9532687&Exemplar=1&LAN=DE A1 Acharya, Aravinda A1 Naresh, Nikita A1 Narayanan, Prakash A1 Parekhji, Rubin A1 Roush, Kevin A1 Ibarra, Humberto A1 Sheth, Rajiv A1 Flora, Clarence A1 Pradeep, Wilson YR 2021 K1 Analytical models K1 Random access memory K1 Automatic test pattern generation K1 Tools K1 Silicon K1 Data models K1 Safety K1 Digital circuit testing K1 fault models K1 cell aware test K1 small delay defects K1 RAM sequential ATPG K1 low DPPM K1 ATPG pattern optimization SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITCIndia52672.2021.9532687 DO https://doi.org/10.1109/ITCIndia52672.2021.9532687 SF ELIB - SuUB Bremen
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