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Evaluation of material profiles for III-V nanowire photodet..:
, In:
2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
,
Martinez-Oliver, Cristina
;
Moselund, Kirsten E.
;
Georgiev, Vihar P.
- p. 39-40 , 2021
Link:
https://doi.org/10.1109/NUSOD52207.2021.9541533
RT T1 <cTitle>2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)</cTitle>: T1 <Title>Evaluation of material profiles for III-V nanowire photodetectors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9541533&Exemplar=1&LAN=DE A1 Martinez-Oliver, Cristina A1 Moselund, Kirsten E. A1 Georgiev, Vihar P. YR 2021 SN 2158-3242 K1 Performance evaluation K1 Dark current K1 Numerical simulation K1 Photodetectors K1 Nanoscale devices K1 Pins K1 Photoconductivity SP 39 OP 40 LK http://dx.doi.org/https://doi.org/10.1109/NUSOD52207.2021.9541533 DO https://doi.org/10.1109/NUSOD52207.2021.9541533 SF ELIB - SuUB Bremen
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