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1 Ergebnisse
1
Evaluation and Analysis of Commercial 1200V Rated SiC Diode..:
, In:
2021 IEEE Region 10 Symposium (TENSYMP)
,
Bae, Dongwoo
;
Kim, Kiseog
;
Woo, Seungjoo
... - p. 1-7 , 2021
Link:
https://doi.org/10.1109/TENSYMP52854.2021.9550836
RT T1
2021 IEEE Region 10 Symposium (TENSYMP)
: T1
Evaluation and Analysis of Commercial 1200V Rated SiC Diodes with SEBO (Single-Event Burnout) Radiation Test Equipment
UL https://suche.suub.uni-bremen.de/peid=ieee-9550836&Exemplar=1&LAN=DE A1 Bae, Dongwoo A1 Kim, Kiseog A1 Woo, Seungjoo A1 Kang, Yunho A1 Chung, Sungsoo A1 Kih, Joongsik A1 Kim, Youngboo A1 Seong, Yongmin YR 2021 SN 2642-6102 K1 Schottky diodes K1 Breakdown voltage K1 Data analysis K1 Correlation K1 Silicon carbide K1 Failure analysis K1 Life estimation K1 Single-event burnout(SEBO) K1 Single Event Effects K1 SiC Schottky diode K1 Radiation Test SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/TENSYMP52854.2021.9550836 DO https://doi.org/10.1109/TENSYMP52854.2021.9550836 SF ELIB - SuUB Bremen
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