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1 Ergebnisse
1
Study on resistance to tracking of epoxy resin micron compo..:
, In:
2021 China International Conference on Electricity Distribution (CICED)
,
Yang, Ling
;
Chen, Yingping
;
Huang, Jisheng
... - p. 275-279 , 2021
Link:
https://doi.org/10.1109/CICED50259.2021.9556764
RT T1
2021 China International Conference on Electricity Distribution (CICED)
: T1
Study on resistance to tracking of epoxy resin micron composites
UL https://suche.suub.uni-bremen.de/peid=ieee-9556764&Exemplar=1&LAN=DE A1 Yang, Ling A1 Chen, Yingping A1 Huang, Jisheng A1 Wang, Ya A1 Dong, Xuesheng A1 Tan, Dongxian YR 2021 SN 2161-749X K1 Resistance K1 Silicon compounds K1 Micrometers K1 Dielectric constant K1 Contacts K1 Epoxy resins K1 Doping K1 Electric track K1 Micron silica K1 Breakdown time SP 275 OP 279 LK http://dx.doi.org/https://doi.org/10.1109/CICED50259.2021.9556764 DO https://doi.org/10.1109/CICED50259.2021.9556764 SF ELIB - SuUB Bremen
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