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1 Ergebnisse
1
In-depth Cryogenic Characterization of 22 nm FDSOI Technolo..:
, In:
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)
,
Han, Hung-Chi
;
Jazaeri, Farzan
;
D'Amico, Antonio
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560181
RT T1 <cTitle>2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)</cTitle>: T1 <Title>In-depth Cryogenic Characterization of 22 nm FDSOI Technology for Quantum Computation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9560181&Exemplar=1&LAN=DE A1 Han, Hung-Chi A1 Jazaeri, Farzan A1 D'Amico, Antonio A1 Zhao, Zhixing A1 Lehmann, Steffen A1 Kretzschmar, Claudia A1 Charbon, Edoardo A1 Enz, Christian YR 2021 SN 2472-9132 K1 Performance evaluation K1 Temperature distribution K1 Temperature dependence K1 Quantum computing K1 Silicon-on-insulator K1 Scattering K1 Cryogenics K1 FDSOI K1 Cryogenic CMOS K1 Quantum Computing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560181 DO https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560181 SF ELIB - SuUB Bremen
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