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1 Ergebnisse
1
High Temperature Influence on the Trade-off between gm/ID a..:
, In:
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)
,
Silva, Vanessa C. P.
;
Martino, Joao A.
;
Simoen, Eddy
.. - p. 1-4 , 2021
Link:
https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560185
RT T1 <cTitle>2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)</cTitle>: T1 <Title>High Temperature Influence on the Trade-off between gm/ID and fT of nanosheet NMOS Transistors with Different Metal Gate Stack</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9560185&Exemplar=1&LAN=DE A1 Silva, Vanessa C. P. A1 Martino, Joao A. A1 Simoen, Eddy A1 Veloso, Anabela A1 Agopian, Paula G. D. YR 2021 SN 2472-9132 K1 Integrated circuits K1 Degradation K1 Temperature dependence K1 Temperature K1 Metals K1 Voltage K1 Logic gates K1 Nanosheets (NS) K1 MOSFET K1 Analog operation K1 fT K1 Transistor Efficiency SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560185 DO https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560185 SF ELIB - SuUB Bremen
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