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1 Ergebnisse
1
Dark Count Rate in Single-Photon Avalanche Diodes: Characte..:
, In:
ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)
,
Sicre, Mathieu
;
Agnew, Megan
;
Buj, Christel
... - p. 143-146 , 2021
Link:
https://doi.org/10.1109/ESSCIRC53450.2021.9567806
RT T1 <cTitle>ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)</cTitle>: T1 <Title>Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9567806&Exemplar=1&LAN=DE A1 Sicre, Mathieu A1 Agnew, Megan A1 Buj, Christel A1 Coignus, Jean A1 Golanski, Dominique A1 Helleboid, Remi A1 Mamdy, Bastien A1 Nicholson, Isobel A1 Pellegrini, Sara A1 Rideau, Denis A1 Roy, David A1 Calmon, Francis YR 2021 K1 Temperature measurement K1 Location awareness K1 Semiconductor device measurement K1 Voltage measurement K1 Design automation K1 Electric breakdown K1 Computational modeling K1 Single-Photon Avalanche Diode K1 breakdown probability K1 Dark Count Rate K1 defects K1 Technology Computer-Aided Design SP 143 OP 146 LK http://dx.doi.org/https://doi.org/10.1109/ESSCIRC53450.2021.9567806 DO https://doi.org/10.1109/ESSCIRC53450.2021.9567806 SF ELIB - SuUB Bremen
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