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Industrial best practice: cases of study by automotive chip..:

, In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Abbati, L. Degli ; Ullmann, R. ; Paganini, G.... - p. 1-6 , 2021
Link: https://doi.org/10.1109/DFT52944.2021.9568350