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A Tunable Single Event Transient Filter Based on Digitally ..:

, In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Andjelkovic, Marko ; Schrape, Oliver ; Breitenreiter, Anselm.. - p. 1-6 , 2021
Link: https://doi.org/10.1109/DFT52944.2021.9568355