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1 Ergebnisse
1
A new Robust Short-Circuit Protection Gate-Driver Circuit f..:
, In:
2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)
,
Scholl, Felix
;
Fuhrmann, Jan
;
da Cunha, Julian
. - p. 1-10 , 2021
Link:
https://doi.org/10.23919/EPE21ECCEEurope50061.2021.957..
RT T1 <cTitle>2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)</cTitle>: T1 <Title>A new Robust Short-Circuit Protection Gate-Driver Circuit for IGBT with high Desaturation Current</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9570635&Exemplar=1&LAN=DE A1 Scholl, Felix A1 Fuhrmann, Jan A1 da Cunha, Julian A1 Eckel, Hans-Gunter YR 2021 K1 Insulated gate bipolar transistors K1 Temperature K1 Short-circuit currents K1 Europe K1 Switching loss K1 Logic gates K1 Robustness K1 «Short circuit» K1 «Intelligent gate driver» K1 «IGBT» K1 «power semiconductor device» K1 «Robustness» SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.23919/EPE21ECCEEurope50061.2021.9570635 DO https://doi.org/10.23919/EPE21ECCEEurope50061.2021.9570635 SF ELIB - SuUB Bremen
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