I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Silicon Defect Observation From Ultra-Thick Sample Using TE..:

, In: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Lee, Gek Li ; Lee, Kok Wah ; Zhu, Jie - p. 1-4 , 2021
Link: https://doi.org/10.1109/IPFA53173.2021.9617449