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Degradation mechanism of D-mode GaN HEMT based on high temp..:

, In: 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
Lu, Meng ; Chen, Yiqiang ; Liao, Min... - p. 167-170 , 2021
Link: https://doi.org/10.1109/WiPDAAsia51810.2021.9656047