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1
The protection of LP-WAN Endpoints via TEE: a Chemical Stor..:
, In:
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)
,
Coppolino, Luigi
;
D'Antonio, Salvatore
;
Mazzeo, Giovanni
... - p. 345-352 , 2021
Link:
https://doi.org/10.1109/ISSREW53611.2021.00100
RT T1 <cTitle>2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)</cTitle>: T1 <Title>The protection of LP-WAN Endpoints via TEE: a Chemical Storage Case Study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9700193&Exemplar=1&LAN=DE A1 Coppolino, Luigi A1 D'Antonio, Salvatore A1 Mazzeo, Giovanni A1 Romano, Luigi A1 Bonetti, Irene A1 Spagnuolo, Elena YR 2021 K1 Trusted computing K1 Protocols K1 Program processors K1 Software reliability K1 Security K1 Servers K1 Monitoring K1 IIoT K1 LP WAN K1 LoRa K1 Trusted Computing K1 ARM TrustZone K1 Intel SGX SP 345 OP 352 LK http://dx.doi.org/https://doi.org/10.1109/ISSREW53611.2021.00100 DO https://doi.org/10.1109/ISSREW53611.2021.00100 SF ELIB - SuUB Bremen
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