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1 Ergebnisse
1
Automated Defect Inspection in Reverse Engineering of Integ..:
, In:
2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)
,
Bette, Ann-Christin
;
Brus, Patrick
;
Balazs, Gabor
.. - p. 1809-1818 , 2022
Link:
https://doi.org/10.1109/WACV51458.2022.00187
RT T1 <cTitle>2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</cTitle>: T1 <Title>Automated Defect Inspection in Reverse Engineering of Integrated Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9707067&Exemplar=1&LAN=DE A1 Bette, Ann-Christin A1 Brus, Patrick A1 Balazs, Gabor A1 Ludwig, Matthias A1 Knoll, Alois YR 2022 SN 2642-9381 K1 Integrated circuits K1 Training K1 Head K1 Reverse engineering K1 Layout K1 Manuals K1 Inspection K1 Industrial Inspection Datasets; Evaluation and Comparison of Vision Algorithms; Deep Learning -> Efficient Training and Inference Methods for Networks; Explainable AI; Fairness; Accountability; Privacy and Ethics in Vision; Object Detection/Recognition/Categorization; Vision Systems and Applications SP 1809 OP 1818 LK http://dx.doi.org/https://doi.org/10.1109/WACV51458.2022.00187 DO https://doi.org/10.1109/WACV51458.2022.00187 SF ELIB - SuUB Bremen
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