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1 Ergebnisse
1
Do Different Deep Metric Learning Losses Lead to Similar Le..:
, In:
2021 IEEE/CVF International Conference on Computer Vision (ICCV)
,
Kobs, Konstantin
;
Steininger, Michael
;
Dulny, Andrzej
. - p. 10624-10634 , 2021
Link:
https://doi.org/10.1109/ICCV48922.2021.01047
RT T1 <cTitle>2021 IEEE/CVF International Conference on Computer Vision (ICCV)</cTitle>: T1 <Title>Do Different Deep Metric Learning Losses Lead to Similar Learned Features?</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9710183&Exemplar=1&LAN=DE A1 Kobs, Konstantin A1 Steininger, Michael A1 Dulny, Andrzej A1 Hotho, Andreas YR 2021 SN 2380-7504 K1 Measurement K1 Learning systems K1 Analytical models K1 Visualization K1 Computer vision K1 Three-dimensional displays K1 Image color analysis K1 Representation learning; Datasets and evaluation; Explainable AI SP 10624 OP 10634 LK http://dx.doi.org/https://doi.org/10.1109/ICCV48922.2021.01047 DO https://doi.org/10.1109/ICCV48922.2021.01047 SF ELIB - SuUB Bremen
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