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Defects Determination and Diagnosis in Bare Dice for High R..:

, In: 2022 IEEE Fourth International Conference on Advances in Electronics, Computers and Communications (ICAECC),
Lonkadi, Suma S ; Varalakshmi, V ; Raviprakash, S V.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/ICAECC54045.2022.9716627