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Employing Nanoscale Surface Characterizations in a Field Em..:

, In: 2020 IEEE International Conference on Plasma Science (ICOPS),
Hopkins, Matthew M. ; Jindal, Ashish K. ; Bussmann, Ezra... - p. 110-110 , 2020
Link: https://doi.org/10.1109/ICOPS37625.2020.9717571