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1 Ergebnisse
1
22 nm FD-SOI MOSFET Figures of Merit at high temperatures u..:
, In:
2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
,
Halder, Arka
;
Nyssens, Lucas
;
Rack, Martin
... - p. 27-30 , 2022
Link:
https://doi.org/10.1109/SiRF53094.2022.9720052
RT T1
2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
: T1
22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C
UL https://suche.suub.uni-bremen.de/peid=ieee-9720052&Exemplar=1&LAN=DE A1 Halder, Arka A1 Nyssens, Lucas A1 Rack, Martin A1 Lederer, Dimitri A1 Kilchytska, Valeriya A1 Raskin, Jean-Pierre YR 2022 SN 2474-9761 K1 Temperature measurement K1 Radio frequency K1 Degradation K1 MOSFET K1 Temperature distribution K1 Atmospheric measurements K1 Current measurement K1 FDSOI K1 fT K1 fmax K1 Figures of Merit (FoMs) K1 high temperature SP 27 OP 30 LK http://dx.doi.org/https://doi.org/10.1109/SiRF53094.2022.9720052 DO https://doi.org/10.1109/SiRF53094.2022.9720052 SF ELIB - SuUB Bremen
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