I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Gate-Last I/O Transistors based on Stacked Gate-All-Around ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Bhuiyan, M. ; Kim, M. ; Zhou, H.... - p. 1-4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720507