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High-Density and High-Speed 4T FinFET SRAM for Cryogenic Co..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Hu, Vita Pi-Ho ; Liu, Chang-Ju ; Chiang, Hung-Li... - p. 8.6.1-8.6.4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720511