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1 Ergebnisse
1
Accurate Picture of Cycling Degradation in HfO2-FeFET Based..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Ichihara, Reika
;
Higashi, Yusuke
;
Suzuki, Kunifumi
... - p. 6.3.1-6.3.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720516
RT T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Accurate Picture of Cycling Degradation in HfO2-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9720516&Exemplar=1&LAN=DE A1 Ichihara, Reika A1 Higashi, Yusuke A1 Suzuki, Kunifumi A1 Takano, Keisuke A1 Yoshimura, Yoko A1 Hamai, Takamasa A1 Takahashi, Kota A1 Matsuo, Kazuhiro A1 Nakasaki, Yasushi A1 Suzuki, Masamichi A1 Kamimuta, Yuuichi A1 Saitoh, Masumi YR 2021 SN 2156-017X K1 Degradation K1 Iron K1 Hafnium compounds K1 Performance analysis K1 Electron devices K1 FeFETs SP 6.3.1 OP 6.3.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720516 DO https://doi.org/10.1109/IEDM19574.2021.9720516 SF ELIB - SuUB Bremen
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