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Thorough Investigation of Low Frequency Noise Mechanisms in..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Kammeugne, R. Kom ; Theodorou, C. ; Leroux, C.... - p. 39.4.1-39.4.4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720522