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Design and Optimization of SRAM Macro and Logic Using Backs..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Chen, R. ; Sisto, G. ; Jourdain, A.... - p. 22.4.1-22.4.4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720528