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1 Ergebnisse
1
65nm RFSOI Power Amplifier Transistor Ageing at mm W freque..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Divay, A.
;
Forest, J.
;
Knopik, V.
... - p. 39.3.1-39.3.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720531
RT T1
2021 IEEE International Electron Devices Meeting (IEDM)
: T1
65nm RFSOI Power Amplifier Transistor Ageing at mm W frequencies, 14 GHz and 28 GHz
UL https://suche.suub.uni-bremen.de/peid=ieee-9720531&Exemplar=1&LAN=DE A1 Divay, A. A1 Forest, J. A1 Knopik, V. A1 Hai, J. A1 Revil, N. A1 Antonijevic, J. A1 Michard, A. A1 Cacho, F. A1 Vincent, E. A1 Gaillard, F. A1 Garros, X. YR 2021 SN 2156-017X K1 Radio frequency K1 Performance evaluation K1 Human computer interaction K1 5G mobile communication K1 Power amplifiers K1 Aging K1 Transistors SP 39.3.1 OP 39.3.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720531 DO https://doi.org/10.1109/IEDM19574.2021.9720531 SF ELIB - SuUB Bremen
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