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1 Ergebnisse
1
Monolithic 3D Integration of Logic, Memory and Computing-In..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Li, Yijun
;
Tang, Jianshi
;
Gao, Bin
... - p. 21.5.1-21.5.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720534
RT T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Monolithic 3D Integration of Logic, Memory and Computing-In-Memory for One-Shot Learning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9720534&Exemplar=1&LAN=DE A1 Li, Yijun A1 Tang, Jianshi A1 Gao, Bin A1 Yao, Jian A1 Xi, Yue A1 Li, Yuankun A1 Li, Tingyu A1 Zhou, Ying A1 Liu, Zhengwu A1 Zhang, Qingtian A1 Qiu, Song A1 Li, Qingwen A1 Qian, He A1 Wu, Huaqiang YR 2021 SN 2156-017X K1 Semiconductor device measurement K1 MOSFET K1 Feature extraction K1 Common Information Model (computing) K1 Silicon K1 CNTFETs K1 Artificial intelligence SP 21.5.1 OP 21.5.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720534 DO https://doi.org/10.1109/IEDM19574.2021.9720534 SF ELIB - SuUB Bremen
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