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1 Ergebnisse
1
28nm CIS-Compatible Embedded STT-MRAM for Frame Buffer Memo..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Lee, K.
;
Kim, D. S.
;
Bak, J. H.
... - p. 2.1.1-2.1.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720537
RT T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>28nm CIS-Compatible Embedded STT-MRAM for Frame Buffer Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9720537&Exemplar=1&LAN=DE A1 Lee, K. A1 Kim, D. S. A1 Bak, J. H. A1 Ko, S. P. A1 Lim, W. C. A1 Shin, H. C. A1 Lee, J. H. A1 Park, J. H. A1 Jeong, J. H. A1 Lee, J. M. A1 Kai, T. A1 Sato, H. A1 Lee, J. W. A1 Ryu, K. H. A1 Kim, Y. J. A1 Han, S. H. A1 Seo, B. Y. A1 Suh, K. S. A1 Kim, H. H. A1 Jung, H. T. A1 Jang, D. H. A1 Ji, N. Y. A1 Eom, M. J. A1 Kim, I. H. A1 Lee, K. A1 Hwang, K. H. A1 Song, Y. J. A1 Kim, H. S. YR 2021 SN 2156-017X K1 Heating systems K1 Scalability K1 Random access memory K1 FinFETs K1 Electron devices K1 Standards SP 2.1.1 OP 2.1.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720537 DO https://doi.org/10.1109/IEDM19574.2021.9720537 SF ELIB - SuUB Bremen
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