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1 Ergebnisse
1
First Experimental Demonstration of MRAM Data Scrubbing: 80..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Wu, H.
;
Katragadda, V.
;
Evarts, E.
... - p. 2.3.1-2.3.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720539
RT T1
2021 IEEE International Electron Devices Meeting (IEDM)
: T1
First Experimental Demonstration of MRAM Data Scrubbing: 80 Mb MRAM with 40 nm junctions for Last Level Cache Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9720539&Exemplar=1&LAN=DE A1 Wu, H. A1 Katragadda, V. A1 Evarts, E. A1 Edwards, E. A1 Southwick, R. A1 Dutta, A. A1 Lauer, G. A1 Mehta, V. A1 Johnson, R. A1 van der Straten, O. A1 Reznicek, A. A1 Wordeman, M. A1 Rizzolo, M. A1 Patlolla, R. A1 Metzler, D. A1 Yang, C. A1 Edelstein, D. A1 Canaperi, D. A1 Teehan, S. A1 Slaughter, J.M. A1 Worledge, D.C. YR 2021 SN 2156-017X K1 Degradation K1 Electric potential K1 Error analysis K1 Switches K1 Data models K1 Error correction codes K1 Arrays SP 2.3.1 OP 2.3.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720539 DO https://doi.org/10.1109/IEDM19574.2021.9720539 SF ELIB - SuUB Bremen
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