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Uncertainty Quantification Based on Multilevel Conductance ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Yan, Longhao ; Li, Xi ; Zhu, Yihang... - p. 28.2.1-28.2.4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720555