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1 Ergebnisse
1
A Novel High-Endurance FeFET Memory Device Based on ZrO2 An..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Liang, Zhongxin
;
Tang, Kechao
;
Dong, Junchen
... - p. 17.3.1-17.3.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720627
RT T1
2021 IEEE International Electron Devices Meeting (IEDM)
: T1
A Novel High-Endurance FeFET Memory Device Based on ZrO2 Anti-Ferroelectric and IGZO Channel
UL https://suche.suub.uni-bremen.de/peid=ieee-9720627&Exemplar=1&LAN=DE A1 Liang, Zhongxin A1 Tang, Kechao A1 Dong, Junchen A1 Li, Qijun A1 Zhou, Yuejia A1 Zhu, Runteng A1 Wu, Yanqing A1 Han, Dedong A1 Huang, Ru YR 2021 SN 2156-017X K1 Electrodes K1 Pulse measurements K1 Nonvolatile memory K1 Capacitance-voltage characteristics K1 Current measurement K1 Crystallization K1 Logic gates SP 17.3.1 OP 17.3.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720627 DO https://doi.org/10.1109/IEDM19574.2021.9720627 SF ELIB - SuUB Bremen
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