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1 Ergebnisse
1
Comprehensive Understanding of the HZO-based n/pFeFET Opera..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Kuk, Song-Hyeon
;
Han, Seung-Min
;
Kim, Bong-Ho
... - p. 33.6.1-33.6.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720642
RT T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Comprehensive Understanding of the HZO-based n/pFeFET Operation and Device Performance Enhancement Strategy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9720642&Exemplar=1&LAN=DE A1 Kuk, Song-Hyeon A1 Han, Seung-Min A1 Kim, Bong-Ho A1 Baek, Seung-Hyub A1 Han, Jae-Hoon A1 Kim, Sang-hyeon YR 2021 SN 2156-017X K1 Performance evaluation K1 Electron traps K1 Pulse measurements K1 Density measurement K1 Nonvolatile memory K1 Capacitance-voltage characteristics K1 Switches SP 33.6.1 OP 33.6.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720642 DO https://doi.org/10.1109/IEDM19574.2021.9720642 SF ELIB - SuUB Bremen
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