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Demonstration of Low EOT Gate Stack and Record Transconduct..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Li, W. ; Wang, L. C. ; Cheema, S. S.... - p. 13.6.1-13.6.4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720658