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Improved Multi-bit Storage Reliablity by Design of Ferroele..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Xu, Yannan ; Yang, Yang ; Zhao, Shengjie... - p. 6.2.1-6.2.4 , 2021
Link: https://doi.org/10.1109/IEDM19574.2021.9720659