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1 Ergebnisse
1
Contact Engineering for High-Performance N-Type 2D Semicond..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Lin, Y.
;
Shen, P.-C.
;
Su, C.
... - p. 37.2.1-37.2.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720668
RT T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Contact Engineering for High-Performance N-Type 2D Semiconductor Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9720668&Exemplar=1&LAN=DE A1 Lin, Y. A1 Shen, P.-C. A1 Su, C. A1 Chou, A.-S. A1 Wu, T. A1 Cheng, C.-C. A1 Park, J.-H. A1 Chiu, M.-H. A1 Lu, A.-Y. A1 Tang, H.-L. A1 Tavakoli, M. M. A1 Pitner, G. A1 Ji, X. A1 McGahan, C. A1 Wang, X. A1 Cai, Z. A1 Mao, N. A1 Wang, J. A1 Wang, Y. A1 Tisdale, W. A1 Ling, X. A1 Aidala, K. E. A1 Tung, V. A1 Li, J. A1 Zettl, A. A1 Wu, C.-I. A1 Guo, Jing A1 Wang, H. A1 Bokor, J. A1 Palacios, T. A1 Li, L.-J. A1 Kong, J. YR 2021 SN 2156-017X K1 Performance evaluation K1 Two dimensional displays K1 Contact resistance K1 Ohmic contacts K1 Transistors K1 Electron devices K1 Passivation SP 37.2.1 OP 37.2.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720668 DO https://doi.org/10.1109/IEDM19574.2021.9720668 SF ELIB - SuUB Bremen
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