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3D sequential integration: applications and associated key ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),

Batude, P. ; Billoint, O. ; Thuries, S.... - p. 3.2.1-3.2.4 , 2021

Link: https://doi.org/10.1109/IEDM19574.2021.9720671

RT 
T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>3D sequential integration: applications and associated key enabling modules (design & technology)</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9720671&Exemplar=1&LAN=DE
				
A1 Batude, P.
A1 Billoint, O.
A1 Thuries, S.
A1 Malinge, P.
A1 Fenouillet-Beranger, C.
A1 Peizerat, A.
A1 Sicard, G.
A1 Vivet, P.
A1 Reboh, S.
A1 Cavalcante, C.
A1 Brunet, L.
A1 Ribotta, M.
A1 Brevard, L.
A1 Garros, X.
A1 Frutuoso, T. Mota
A1 Sklenard, B.
A1 Lacord, J.
A1 Kanyandekwe, J.
A1 Kerdiles, S.
A1 Sideris, P.
A1 Theodorou, C.
A1 Lapras, V.
A1 Mouhdach, M.
A1 Gaudin, G.
A1 Besnard, G.
A1 Radu, I.
A1 Ponthenier, F.
A1 Farcy, A.
A1 Jesse, E.
A1 Guyader, F.
A1 Matheret, T.
A1 Brunet, P.
A1 Milesi, F.
A1 Van-Jodin, L. Le
A1 Sarrazin, A.
A1 Perrin, B.
A1 Moulin, C.
A1 Maitrejean, S.
A1 Alepidis, M.
A1 Ionica, I.
A1 Cristoloveanu, S.
A1 Gaillard, F.
A1 Vinet, M.
A1 Andrieu, F.
A1 Arcamone, J.
A1 Ollier, E.
YR 2021
SN 2156-017X
K1 Performance evaluation
K1 Three-dimensional displays
K1 Design methodology
K1 Electron devices
SP 3.2.1
OP 3.2.4
LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720671
DO https://doi.org/10.1109/IEDM19574.2021.9720671
SF ELIB - SuUB Bremen

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