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1 Ergebnisse
1
High Throughput Neuromorphic Brain Interface with CuOx Resi..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Shi, Yuhan
;
Ananthakrishnan, Akshay
;
Oh, Sangheon
... - p. 16.5.1-16.5.4 , 2021
Link:
https://doi.org/10.1109/IEDM19574.2021.9720712
RT T1 <cTitle>2021 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>High Throughput Neuromorphic Brain Interface with CuOx Resistive Crossbars for Real-time Spike Sorting</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9720712&Exemplar=1&LAN=DE A1 Shi, Yuhan A1 Ananthakrishnan, Akshay A1 Oh, Sangheon A1 Liu, Xin A1 Hota, Gopabandhu A1 Cauwenberghs, Gert A1 Kuzum, Duygu YR 2021 SN 2156-017X K1 Voltage measurement K1 Neuromorphics K1 Convolution K1 Neurons K1 Throughput K1 Real-time systems K1 Hardware SP 16.5.1 OP 16.5.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19574.2021.9720712 DO https://doi.org/10.1109/IEDM19574.2021.9720712 SF ELIB - SuUB Bremen
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