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A 1/1.57-inch 50Mpixel CMOS Image Sensor With 1.0μm All-Dir..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),

Jung, Taesub ; Fujita, Masato ; Cho, Jeongjin... - p. 102-104 , 2022

Link: https://doi.org/10.1109/ISSCC42614.2022.9731567

RT 
T1 <cTitle>2022 IEEE International Solid- State Circuits Conference (ISSCC)</cTitle>: T1 <Title>A 1/1.57-inch 50Mpixel CMOS Image Sensor With 1.0μm All-Directional Dual Pixel by 0.5μm-Pitch Full-Depth Deep-Trench Isolation Technology</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9731567&Exemplar=1&LAN=DE
				
A1 Jung, Taesub
A1 Fujita, Masato
A1 Cho, Jeongjin
A1 Lee, Kyungduck
A1 Seol, Doosik
A1 An, Sungmin
A1 Lee, Chanhee
A1 Jeong, Youjin
A1 Jung, Minji
A1 Park, Sachoun
A1 Baek, Seungki
A1 Jung, Seungki
A1 Lee, Seunghwan
A1 Yun, Jungbin
A1 Shim, Eun Sub
A1 Han, Heetak
A1 Park, Eunkyung
A1 Sul, Haesick
A1 Kang, Sehyeon
A1 Lee, Kyungho
A1 Ahn, JungChak
A1 Chang, Duckhyun
YR 2022
SN 2376-8606
K1 Image quality
K1 Degradation
K1 Image resolution
K1 Ultraviolet sources
K1 CMOS image sensors
K1 Isolation technology
K1 Dynamic range
SP 102
OP 104
LK http://dx.doi.org/https://doi.org/10.1109/ISSCC42614.2022.9731567
DO https://doi.org/10.1109/ISSCC42614.2022.9731567
SF ELIB - SuUB Bremen

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