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A 64Mpixel CMOS Image Sensor with 0.56μm Unit Pixels Separa..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),

Park, Sungbong ; Lee, ChangKyu ; Park, Sangcheon... - p. 1-3 , 2022

Link: https://doi.org/10.1109/ISSCC42614.2022.9731750

RT 
T1 <cTitle>2022 IEEE International Solid- State Circuits Conference (ISSCC)</cTitle>: T1 <Title>A 64Mpixel CMOS Image Sensor with 0.56μm Unit Pixels Separated by Front Deep-Trench Isolation</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9731750&Exemplar=1&LAN=DE
				
A1 Park, Sungbong
A1 Lee, ChangKyu
A1 Park, Sangcheon
A1 Park, Haeyong
A1 Lee, Taeheon
A1 Park, Dami
A1 Heo, Minsung
A1 Park, Inyong
A1 Yeo, Hyunyoung
A1 Lee, Youna
A1 Lee, Juhee
A1 Lee, Beomsuk
A1 Lee, Dong-Chul
A1 Kim, Jinyoung
A1 Kim, Bokwon
A1 Pyo, Jinsun
A1 Quan, Shili
A1 You, Sungyong
A1 Ro, Inho
A1 Choi, Sungsoo
A1 Kim, Sung-In
A1 Joe, In-Sung
A1 Park, Jongeun
A1 Koo, Chang-Hyo
A1 Kim, Jae-Ho
A1 Chang, Chong Kwang
A1 Kim, Taehee
A1 Kim, JinGyun
A1 Lee, Jamie
A1 Kim, Hyunchul
A1 Moon, Chang-rok
A1 Kim, Hyoung-Sub
YR 2022
SN 2376-8606
K1 Optical filters
K1 Optical device fabrication
K1 Dark current
K1 CMOS image sensors
K1 Optical crosstalk
K1 Optical imaging
K1 Optical sensors
SP 1
OP 3
LK http://dx.doi.org/https://doi.org/10.1109/ISSCC42614.2022.9731750
DO https://doi.org/10.1109/ISSCC42614.2022.9731750
SF ELIB - SuUB Bremen

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