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New Approach of Single Event Latchup Modeling Based on TCAD..:
, In:
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Truyen, D.
;
Montagner, L.
- p. 1-4 , 2019
Link:
https://doi.org/10.1109/RADECS47380.2019.9745658
RT T1
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
New Approach of Single Event Latchup Modeling Based on TCAD Simulations and Design of Experiment Analysis
UL https://suche.suub.uni-bremen.de/peid=ieee-9745658&Exemplar=1&LAN=DE A1 Truyen, D. A1 Montagner, L. YR 2019 SN 1609-0438 K1 Analytical models K1 Sensitivity K1 Costs K1 Single event latchup K1 Radiation hardening (electronics) K1 Layout K1 Europe K1 Single Event Latch-up K1 SEL K1 Radiation Tolerant K1 COTS K1 SEL Modeling K1 CMOS K1 DOE SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS47380.2019.9745658 DO https://doi.org/10.1109/RADECS47380.2019.9745658 SF ELIB - SuUB Bremen
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