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Total Ionizing Dose Characterization of 28 nm PolarFire SON..:
, In:
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Rezzak, Nadia
;
Wang, Jih-Jong
;
Cai, Alex
.. - p. 1-6 , 2019
Link:
https://doi.org/10.1109/RADECS47380.2019.9745684
RT T1 <cTitle>2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Total Ionizing Dose Characterization of 28 nm PolarFire SONOS-based FPGA</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9745684&Exemplar=1&LAN=DE A1 Rezzak, Nadia A1 Wang, Jih-Jong A1 Cai, Alex A1 Hawley, Frank A1 Hamdy, Esmat YR 2019 SN 1609-0438 K1 SONOS devices K1 Performance evaluation K1 Degradation K1 Power supplies K1 Europe K1 Transistors K1 Total ionizing dose K1 SONOS memories K1 retention K1 total ionizing dose (TID) K1 gamma ray testing K1 x-ray testing SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/RADECS47380.2019.9745684 DO https://doi.org/10.1109/RADECS47380.2019.9745684 SF ELIB - SuUB Bremen
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