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Proton Effect Test Compare to ZnO Thin-Film Transistors wit..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Kim, Yu-Mi ; Jeong, Jun-Kyo ; Lee, Ga-Won - p. 01-03 , 2019
Link: https://doi.org/10.1109/RADECS47380.2019.9745690