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1 Ergebnisse
1
Total Ionizing Dose and Single-Events characterization of X..:
, In:
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Maillard, Pierre
;
Barton, Jeff
;
Hart, Michael J.
.. - p. 1-6 , 2019
Link:
https://doi.org/10.1109/RADECS47380.2019.9745695
RT T1
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Total Ionizing Dose and Single-Events characterization of Xilinx 20nm Kintex UltraScale™
UL https://suche.suub.uni-bremen.de/peid=ieee-9745695&Exemplar=1&LAN=DE A1 Maillard, Pierre A1 Barton, Jeff A1 Hart, Michael J. A1 Chen, Yanran P. A1 Voogel, Martin L. YR 2019 SN 1609-0438 K1 Protons K1 Current measurement K1 Layout K1 Single event upsets K1 X-rays K1 Total ionizing dose K1 Leakage currents K1 Xilinx UltraScale K1 Kintex K1 XQR K1 TID K1 SEL K1 SEU SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/RADECS47380.2019.9745695 DO https://doi.org/10.1109/RADECS47380.2019.9745695 SF ELIB - SuUB Bremen
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