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1 Ergebnisse
1
Pulse-modulation Eddy Current Imaging and Evaluation of Hid..:
, In:
2021 IEEE Far East NDT New Technology & Application Forum (FENDT)
,
Liu, Zhengshuai
;
Li, Yong
;
Ren, Shuting
... - p. 303-308 , 2021
Link:
https://doi.org/10.1109/FENDT54151.2021.9749679
RT T1 <cTitle>2021 IEEE Far East NDT New Technology & Application Forum (FENDT)</cTitle>: T1 <Title>Pulse-modulation Eddy Current Imaging and Evaluation of Hidden Flaws in Layered Conductors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9749679&Exemplar=1&LAN=DE A1 Liu, Zhengshuai A1 Li, Yong A1 Ren, Shuting A1 Ren, Yanzhao A1 Yan, Bei A1 Chen, Zhenmao YR 2021 K1 Analytical models K1 Sensitivity K1 Computational modeling K1 Imaging K1 Inspection K1 Conductors K1 Finite element analysis K1 electromagnetic nondestructive evaluation K1 pulse-modulation eddy current inspection K1 analytical modelling K1 hidden flaw K1 stratified conductor SP 303 OP 308 LK http://dx.doi.org/https://doi.org/10.1109/FENDT54151.2021.9749679 DO https://doi.org/10.1109/FENDT54151.2021.9749679 SF ELIB - SuUB Bremen
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