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1 Ergebnisse
1
Leakage Power, Current and Delay Analysis of Stack ONOFIC B..:
, In:
2022 International Conference on Advances in Computing, Communication and Applied Informatics (ACCAI)
,
Rajashekhar, K.
;
Kiladibaboji
;
Leela, K. Mohana
- p. 1-6 , 2022
Link:
https://doi.org/10.1109/ACCAI53970.2022.9752544
RT T1 <cTitle>2022 International Conference on Advances in Computing, Communication and Applied Informatics (ACCAI)</cTitle>: T1 <Title>Leakage Power, Current and Delay Analysis of Stack ONOFIC Based CMOS Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9752544&Exemplar=1&LAN=DE A1 Rajashekhar, K. A1 Kiladibaboji A1 Leela, K. Mohana YR 2022 K1 Technological innovation K1 CMOS logic circuits K1 Metals K1 Very large scale integration K1 CMOS technology K1 Threshold voltage K1 Delays K1 CMOS circuits K1 stack ONOFIC technique K1 LECTOR technique K1 power dissipation K1 delay K1 leakage current SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ACCAI53970.2022.9752544 DO https://doi.org/10.1109/ACCAI53970.2022.9752544 SF ELIB - SuUB Bremen
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