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1 Ergebnisse
1
Parameter Characterization of Power MOSFET Gate Oxide Degra..:
, In:
2022 International Conference on Power Energy Systems and Applications (ICoPESA)
,
Xu, Guoqing
;
Zhao, Shaohua
;
Wei, Weiwei
- p. 34-39 , 2022
Link:
https://doi.org/10.1109/ICoPESA54515.2022.9754423
RT T1 <cTitle>2022 International Conference on Power Energy Systems and Applications (ICoPESA)</cTitle>: T1 <Title>Parameter Characterization of Power MOSFET Gate Oxide Degradation Based on Current Falling Time during Turn-off Process</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9754423&Exemplar=1&LAN=DE A1 Xu, Guoqing A1 Zhao, Shaohua A1 Wei, Weiwei YR 2022 K1 Degradation K1 Semiconductor device modeling K1 MOSFET K1 Sensitivity K1 Failure analysis K1 Voltage K1 Logic gates K1 Power MOSFET K1 gate oxygen degradation K1 parameter characterization K1 current fall time K1 accelerated degradation SP 34 OP 39 LK http://dx.doi.org/https://doi.org/10.1109/ICoPESA54515.2022.9754423 DO https://doi.org/10.1109/ICoPESA54515.2022.9754423 SF ELIB - SuUB Bremen
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