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First order correction of EELS measurements based on experi..:

, In: 2022 IEEE 19th Annual Workshop on Microelectronics and Electron Devices (WMED),
Liao, Yougui ; Goodwin, Rob ; Harlow, Wayne... - p. 1-4 , 2022
Link: https://doi.org/10.1109/WMED55302.2022.9758034