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1 Ergebnisse
1
Thickness measurement of multi-layered structures using SD-..:
, In:
2022 Workshop on Recent Advances in Photonics (WRAP)
,
Gaikwad, Sunil
;
Patni, Khushi
;
Arulmozhivarman, P.
.. - p. 1-2 , 2022
Link:
https://doi.org/10.1109/WRAP54064.2022.9758325
RT T1
2022 Workshop on Recent Advances in Photonics (WRAP)
: T1
Thickness measurement of multi-layered structures using SD-OCT Imaging System
UL https://suche.suub.uni-bremen.de/peid=ieee-9758325&Exemplar=1&LAN=DE A1 Gaikwad, Sunil A1 Patni, Khushi A1 Arulmozhivarman, P. A1 Balamurugan, S. A1 Makkar, Roshan YR 2022 K1 Optical interferometry K1 Correlation K1 Surgery K1 Coherence K1 Optical imaging K1 Paints K1 Spectral analysis K1 Spectral Domain Optical Coherence Tomography(SD-OCT) K1 non-invasive K1 resolution K1 thickness SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/WRAP54064.2022.9758325 DO https://doi.org/10.1109/WRAP54064.2022.9758325 SF ELIB - SuUB Bremen
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